JPH0327044B2 - - Google Patents

Info

Publication number
JPH0327044B2
JPH0327044B2 JP59096704A JP9670484A JPH0327044B2 JP H0327044 B2 JPH0327044 B2 JP H0327044B2 JP 59096704 A JP59096704 A JP 59096704A JP 9670484 A JP9670484 A JP 9670484A JP H0327044 B2 JPH0327044 B2 JP H0327044B2
Authority
JP
Japan
Prior art keywords
probe
tip
positioning
target
target object
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59096704A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6067806A (ja
Inventor
Hendoritsukusu Fuerudeinando
Haisumisu Teiraa Ratsuseru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS6067806A publication Critical patent/JPS6067806A/ja
Publication of JPH0327044B2 publication Critical patent/JPH0327044B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/02—Sensing devices
    • B25J19/021—Optical sensing devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Programme-controlled manipulators
    • B25J9/10—Programme-controlled manipulators characterised by positioning means for manipulator elements
    • B25J9/1005—Programme-controlled manipulators characterised by positioning means for manipulator elements comprising adjusting means
    • B25J9/1015—Programme-controlled manipulators characterised by positioning means for manipulator elements comprising adjusting means using additional, e.g. microadjustment of the end effector
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Programme-controlled manipulators
    • B25J9/10—Programme-controlled manipulators characterised by positioning means for manipulator elements
    • B25J9/14—Programme-controlled manipulators characterised by positioning means for manipulator elements fluid
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D3/00—Control of position or direction
    • G05D3/12—Control of position or direction using feedback
    • G05D3/20—Control of position or direction using feedback using a digital comparing device

Landscapes

  • Engineering & Computer Science (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Tests Of Electronic Circuits (AREA)
JP59096704A 1983-09-12 1984-05-16 高精度探査装置 Granted JPS6067806A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US530927 1983-09-12
US06/530,927 US4544889A (en) 1983-09-12 1983-09-12 Robot precision probe positioner with guidance optics

Publications (2)

Publication Number Publication Date
JPS6067806A JPS6067806A (ja) 1985-04-18
JPH0327044B2 true JPH0327044B2 (en]) 1991-04-12

Family

ID=24115557

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59096704A Granted JPS6067806A (ja) 1983-09-12 1984-05-16 高精度探査装置

Country Status (4)

Country Link
US (1) US4544889A (en])
EP (1) EP0134573B1 (en])
JP (1) JPS6067806A (en])
DE (1) DE3475364D1 (en])

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2591929A1 (fr) * 1985-12-19 1987-06-26 Photonetics Procede et dispositif de positionnement d'un robot a l'aide de moyens optiques
US4694230A (en) * 1986-03-11 1987-09-15 Usa As Represented By The Secretary Of Commerce Micromanipulator system
EP0239409A1 (en) * 1986-03-28 1987-09-30 Life Technology Research Foundation Robot for surgical operation
US4833590A (en) * 1986-07-15 1989-05-23 Siemens Aktiengesellschaft Method and apparatus for the fine adjustment of an object on a sub-surface of a plane
US4795260A (en) * 1987-05-15 1989-01-03 Therma-Wave, Inc. Apparatus for locating and testing areas of interest on a workpiece
US5030907A (en) * 1989-05-19 1991-07-09 Knights Technology, Inc. CAD driven microprobe integrated circuit tester
US5113133A (en) * 1990-12-20 1992-05-12 Integri-Test Corporation Circuit board test probe
US5469064A (en) * 1992-01-14 1995-11-21 Hewlett-Packard Company Electrical assembly testing using robotic positioning of probes
US5635848A (en) * 1995-03-10 1997-06-03 International Business Machines Corporation Method and system for controlling high-speed probe actuators
US6377066B1 (en) * 1999-07-09 2002-04-23 Mfi Technologies Corporation Method and apparatus for sub-micron imaging and probing on probe station
WO2002003045A2 (en) * 2000-06-30 2002-01-10 Testship Automatic Test Soluti Probe, systems and methods for integrated circuit board testing
AU2001272733A1 (en) 2000-07-19 2002-02-05 Orbotech Ltd. Apparatus and method for electrical testing of electrical circuits
US6518682B2 (en) * 2000-12-04 2003-02-11 Systems, Machines, Automation Components Corporation System monitor for a linear/rotary actuator
US6816294B2 (en) 2001-02-16 2004-11-09 Electro Scientific Industries, Inc. On-the-fly beam path error correction for memory link processing
US7245412B2 (en) 2001-02-16 2007-07-17 Electro Scientific Industries, Inc. On-the-fly laser beam path error correction for specimen target location processing
US8497450B2 (en) 2001-02-16 2013-07-30 Electro Scientific Industries, Inc. On-the fly laser beam path dithering for enhancing throughput
US6706998B2 (en) 2002-01-11 2004-03-16 Electro Scientific Industries, Inc. Simulated laser spot enlargement
CN1977171A (zh) * 2004-04-20 2007-06-06 泰肯贸易股份公司 输送或检查液体的装置
DE202008013982U1 (de) * 2008-10-20 2009-01-08 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Messsystem zum Bestimmen von Streuparametern

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL253341A (en]) * 1959-07-02
US3264556A (en) * 1961-12-29 1966-08-02 Bell Telephone Labor Inc Probe positioning device for use in measuring and checking semiconductor specimens
US3405361A (en) * 1964-01-08 1968-10-08 Signetics Corp Fluid actuable multi-point microprobe for semiconductors
US3532807A (en) * 1967-10-05 1970-10-06 Webb James E Automatic closed circuit television arc guidance control
US3502882A (en) * 1968-01-17 1970-03-24 Geza Von Voros Opto-graphical memory and digitalized control system for precision machining
US3786332A (en) * 1969-03-19 1974-01-15 Thomson Houston Comp Francaise Micro positioning apparatus
DE1925152A1 (de) * 1969-05-16 1970-11-19 Jira Thomas J Mikromanipulator
FR2098524A5 (en]) * 1970-07-17 1972-03-10 Thomson Csf
US3891918A (en) * 1971-03-23 1975-06-24 James F Ellis Linear displacement transducer utilizing an oscillator whose average period varies as a linear function of the displacement
US3888362A (en) * 1973-05-31 1975-06-10 Nasa Cooperative multiaxis sensor for teleoperation of article manipulating apparatus
JPS51123565A (en) * 1975-04-21 1976-10-28 Nippon Telegr & Teleph Corp <Ntt> Three-dimention-position differential adjustment of processing article
JPS51131273A (en) * 1975-05-10 1976-11-15 Fujitsu Ltd Wire bonding process
US4203064A (en) * 1977-04-05 1980-05-13 Tokyo Shibaura Electric Co., Ltd. Method for automatically controlling the position of small objects

Also Published As

Publication number Publication date
DE3475364D1 (de) 1988-12-29
US4544889A (en) 1985-10-01
EP0134573B1 (en) 1988-11-23
EP0134573A3 (en) 1986-03-26
EP0134573A2 (en) 1985-03-20
JPS6067806A (ja) 1985-04-18

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